ORMS
Reliability Analysis of Logic Gates Based on Semi-Markov Process
DUI Hong-yan, ZHENG Xiao-qian, CHEN Li-wei, YANG Nan
Operations Research and Management Science . 2021, (5): 66 -72 .  DOI: 10.12005/orms.2021.0146

京ICP备05002817号-5   京公网安备11010802027858号
Copyright © Operations Research and Management Science
Address: Anhui hefei in hefei university of technology institute of system engineering.　Code：230009
Tel：0551-62901503 E-mail: xts_or@hfut.edu.cn
Powered by Beijing Magtech Co., Ltd.