[1] Woodall W H, Spitzner D J, Montgomery D C, Gupta S. Using control charts to monitor process and product quality profiles[J]. Journal of Quality Technology, 2004, 36(3): 309-320. [2] Woodall W H. Current research on profile monitoring[J]. Production, 2007, 17(3): 420-425. [3] Kang Albin, Susan L. On-line monitoring when the process yields a linear profile[J]. Journal of Quality Technology, 2000, 32(4):418-426. [4] Mahmoud M A, Woodall W H, Kim K. On the monitoring of linear profiles[J]. Journal of Quality Technology, 2003, 35(3): 317-328. [5] Zhang J, Li Z, Wang Z. Control chart based on likelihood ratio for monitoring linear profiles[J]. Computational Statistics & Data Analysis, 2009, 53(4): 1440-1448. [6] Williams J D, Contributions to profile monitoring and multivariate statistical process control[J]. 2004.PhD Thesis. Virginia Tech [7] Zou C, Tsung F, Wang Z. Monitoring general linear profiles using multivariate exponentially weighted moving average schemes[J]. Technometrics, 2007, 49(4): 395-408. [8] Jensen W A, Birch J B. Profile monitoring via nonlinear mixed models[J]. Journal of Quality Technology, 2009, 41(1): 18-34. [9] Williams J D, Woodall W H, Birch J B. Statistical monitoring of nonlinear product and process quality profiles[J]. Quality and Reliability Engineering, 2007, 23(8): 925-941. [10] Eric C, Pignatiello J J, Simpson J R. Statistical process monitoring of nonlinear profiles using wavelets[J]. Journal of Quality Technology, 2009, 41(2): 198-212. [11] Zhang H, Albin S. Detecting outliers in complex profiles using a χ2 control chart method[J]. IIE Transactions, 2009, 41(4): 335-345. [12] 王曦, 聂斌,胡雪.非正态变异下的非线性轮廓异常点识别方法研究[J].运筹与管理,2019,28(1):101-107. [13] Colosimo B M, Pacella M. On the use of principal component analysis to identify systematic patterns in roundness profiles[J]. Quality and Reliability Engineering International, 2007, 23. [14] Ding Y, Zeng L, Zhou S. Phase I analysis for monitoring nonlinear profiles in manufacturing processes[J]. Journal of Quality Technology, 2006, 38(3): 199-216. [15] Hung Y C, Tsai W C, Yang S F. Nonparametric profile monitoring in multi-dimensional data spaces[J]. Journal of Process Control, 2012, 22(2): 397-403. [16] Kazemzadeh R B, Noorossana R, Amiri A. Monitoring polynomial profiles in quality control applications[J]. The International Journal of Advanced Manufacturing Technology, 2009, 42(7-8): 703-712. [17] Montgomery D. Introduction to statistical quality control[M]. Introduction to statistical quality control, 1985. [18] Chen Y, Birch J B, Woodall W H. Cluster-based profile analysis in phase I[J]. Journal of Quality Technology, 2015, 47(1): 14-29. [19] Wang K, Jiang W. High-dimensional process monitoring and fault isolation via variable selection[J]. Journal of Quality Technology, 2009, 41(3): 247-258. [20] Zou C, Qiu P. Multivariate statistical process control using LASSO[J]. Publications of the American Statistical Association, 2009, 104(488): 1586-1596. |